Details:
Summary:
During the past eight years the author has presented seven papers detailing various aspects of lateral diffusion error, (LDE) (a.k.a. edge-loss error, translucency error, and translucent blurring error). LDE is caused by the failure of the instrument to see all of the light reflected by a translucent sample. In general, this error is larger when samples of greater translucency are measured. The original aim of the present work was to derive correction functions for each type of instrument which would transform its measurement data to that of a theoretical instrument which has an infinitely large illumination area and a small view area. This paper discusses the merits of the use of presently available methods of correcting for LDE and details a new instrument configuration which allows LDE corrected data to be derived in a single measurement operation.